微米视角实测 IGBT 瞬间温度变化|高速红外热像仪半导体热测试

日期:2026-10-20 07:27
浏览次数:0
摘要:<div style="text-align:center;"> <h1 style="font:400 16px / 24px ui-sans-serif, system-ui, sans-serif, &quot;Apple Color Emoji&quot;, &quot;Segoe UI Emoji&quot;, &quot;Segoe UI Symbol&quot;, &quot;Noto Color Emoji&quot;;white-space:normal;flex:0 1 auto;flex-direction:row;justify-content:normal;align-items:normal;padding:0px;margin:0px;background-image:none;background-position:0% 0%;background-size:auto;background-repeat:repeat;background-attachment:scroll;background-origin:padding-box;background-clip:border-box;"> 微米视角 IGBT 瞬间温度变化测试 </h1> <div style="font-style:normal;font-variant:normal;font-size-adjust:none;font-language-override:normal;font-kerning:auto;font-optical-sizing:auto;font-feature-settings:normal;font-variation-settings:normal;font-stretch:normal;font-family:ui-sans-serif, system-ui, sans-serif, &quot;Apple Color Emoji&quot;, &quot;Segoe UI Emoji&quot;, &quot;Segoe UI Symbol&quot;, &quot;Noto Color Emoji&quot;;font-size:16px;line-height:24px;white-space:normal;flex:0 1 auto;flex-direction:row;justify-content:normal;align-items:normal;padding:0px;margin:0px;background-image:none;background-position:0% 0%;background-size:auto;background-repeat:repeat;background-attachment:scroll;background-origin:padding-box;background-clip:border-box;"> </div> <div style="font-style:normal;font-variant:normal;font-size-adjust:none;font-language-override:normal;font-kerning:auto;font-optical-sizing:auto;font-feature-settings:normal;font-variation-settings:normal;font-stretch:normal;font-family:ui-sans-serif, system-ui, sans-serif, &quot;Apple Color Emoji&quot;, &quot;Segoe UI Emoji&quot;, &quot;Segoe UI Symbol&quot;, &quot;Noto Color Emoji&quot;;font-size:16px;line-height:24px;white-space:normal;flex:0 1 auto;flex-direction:row;justify-content:normal;align-items:normal;padding:0px;margin:0px;background-image:none;background-position:0% 0%;background-size:auto;background-repeat:repeat;background-attachment:scroll;background-origin:padding-box;background-clip:border-box;"> IGBT 是新能源变流器、功率电源里核心功率半导体器件,器件开关瞬间会产生急剧温升,局部热点容易造成器件老化烧毁。 <div style="font-style:normal;font-variant:normal;font-size-adjust:none;font-language-override:normal;font-kerning:auto;font-optical-sizing:auto;font-feature-settings:normal;font-variation-settings:normal;font-stretch:normal;font-family:ui-sans-serif, system-ui, sans-serif, &quot;Apple Color Emoji&quot;, &quot;Segoe UI Emoji&quot;, &quot;Segoe UI Symbol&quot;, &quot;Noto Color Emoji&quot;;line-height:24px;flex:0 1 auto;flex-direction:row;justify-content:normal;align-items:normal;padding:0px;margin:0px;background-image:none;background-position:0% 0%;background-size:auto;background-repeat:repeat;background-attachment:scroll;background-origin:padding-box;background-clip:border-box;"> </div> 本测试采用高速红外热像仪,微米级微观成像,捕捉 IGBT 通电瞬间的温度变化与热量扩散过程,直观展示芯片表面温度分布,定位热点位置。 <div style="font-style:normal;font-variant:normal;font-size-adjust:none;font-language-override:normal;font-kerning:auto;font-optical-sizing:auto;font-feature-settings:normal;font-variation-settings:normal;font-stretch:normal;font-family:ui-sans-serif, system-ui, sans-serif, &quot;Apple Color Emoji&quot;, &quot;Segoe UI Emoji&quot;, &quot;Segoe UI Symbol&quot;, &quot;Noto Color Emoji&quot;;line-height:24px;flex:0 1 auto;flex-direction:row;justify-content:normal;align-items:normal;padding:0px;margin:0px;background-image:none;background-position:0% 0%;background-size:auto;background-repeat:repeat;background-attachment:scroll;background-origin:padding-box;background-clip:border-box;"> </div> 应用场景:功率半导体研发测试、IGBT 热失效分析、芯片热仿真验证、器件可靠性实验、实验室瞬态热成像检测。 </div> <iframe height="550" width="700" src="//player.bilibili.com/player.html?isOutside=true&aid=114197945911993&bvid=BV18EX6YqEJY&cid=28980022070&p=1&autoplay=true&loop=true" scrolling="no" border="0" frameborder="no" framespacing="0" allowfullscreen="true"> </iframe> </div>

微米视角 IGBT 瞬间温度变化测试

IGBT 是新能源变流器、功率电源里核心功率半导体器件,器件开关瞬间会产生急剧温升,局部热点容易造成器件老化烧毁。
本测试采用高速红外热像仪,微米级微观成像,捕捉 IGBT 通电瞬间的温度变化与热量扩散过程,直观展示芯片表面温度分布,定位热点位置。
应用场景:功率半导体研发测试、IGBT 热失效分析、芯片热仿真验证、器件可靠性实验、实验室瞬态热成像检测。
在线留言
姓名:
电话:
您的需求:
 

沪公网安备 31011502007496号